View Larger Image Ion trap in a semiconductor chip Integrated ion chip experiments at the University of Michigan published in聽. Nature Physics Manuscript By administrator|2020-02-21T09:43:07+00:00December 1st, 2005|Science News|0 Comments Share This Story, Choose Your Platform! Email About the Author: administrator Related Posts In-vacuum surface flashover of SiN, AlN, and etched SiO2 thin films at micrometre scales Gallery In-vacuum surface flashover of SiN, AlN, and etched SiO2 thin films at micrometre scales Fast-response low power atomic oven for integration into an ion microchip Gallery Fast-response low power atomic oven for integration into an ion microchip Ultrasensitive Single-ion Electrometry in a Magnetic Field Gradient Gallery Ultrasensitive Single-ion Electrometry in a Magnetic Field Gradient Fast-response low power atomic oven for integration into an ion microchip Gallery Fast-response low power atomic oven for integration into an ion microchip Quantum Control Methods for Robust Entanglement of Trapped Ions Quantum Control Methods for Robust Entanglement of Trapped Ions
